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Si在燕麦籽粒中的富集及其与其它8种元素的关系
引用本文:张国良,樊明寿,陈刚,刘娟,周卫东,孙国荣.Si在燕麦籽粒中的富集及其与其它8种元素的关系[J].生态学报,2009,29(12):6843-6849.
作者姓名:张国良  樊明寿  陈刚  刘娟  周卫东  孙国荣
作者单位:1. 扬州大学江苏省作物遗传生理重点实验室,扬州,225009;淮阴工学院生命科学与化学工程学院,淮安,223001
2. 内蒙古农业大学农学院,内蒙古呼和浩特,010019
3. 扬州大学江苏省作物遗传生理重点实验室,扬州,225009
4. 扬州大学江苏省作物遗传生理重点实验室,扬州,225009;滨州职业学院,滨州,256624
基金项目:国家自然科学基金资助项目,国家863重大科技专项资助项目,江苏省高校"青蓝工程"优秀青年骨干教师资助项目,淮安市产学研合作计划资助项目 
摘    要:通过环境扫描电镜结合X射线电子探针显微分析技术,对22个基因型的燕麦籽粒皮层、糊粉层、近糊粉层和颖果中部的Si含量进行测定.结果表明,Si元素在燕麦籽粒不同部位的含量有明显差异,皮层和糊粉层Si含量较高,近糊粉层和颖果中部含量较低,在颖果中Si主要富集在糊粉层中;而且不同基因型燕麦籽粒同一部位或不同部位Si的积累量也有较大差异,这可能是由遗传差异引起的.糊粉层中的Si含量影响着近糊粉层和颖果中部的Si含量.另外,籽粒不同部位Si含量与P、Ca、Mg、S、Al、Pb含量之间存在显著或极显著的非线性关系,颖果中部的Si含量与K、Cd含量之间不存在显著的非线性关系.说明Si在燕麦籽粒中富集的同时也影响着P、Ca、Mg、S、Al、Pb等元素的富集.

关 键 词:燕麦籽粒  X射线电子探针显微分析  富集
收稿时间:2008/8/20 0:00:00
修稿时间:2009/4/10 0:00:00

Accumulation of silicon in different genotypes of oat grains and its relationship with other eight elements
ZHANG Guo-Liang,FAN Ming-Shou,CHEN Gang,LIU Juan,ZHOU Wei-Dong,SUN Guo-Rong.Accumulation of silicon in different genotypes of oat grains and its relationship with other eight elements[J].Acta Ecologica Sinica,2009,29(12):6843-6849.
Authors:ZHANG Guo-Liang  FAN Ming-Shou  CHEN Gang  LIU Juan  ZHOU Wei-Dong  SUN Guo-Rong
Abstract:Silicon (Si) is the second most abundant element in the earth's crust, the beneficial effects of this element on the growth, development, yield and disease resistance have been observed in a wide variety of plant species. However, the precise distribution of silicon, and its relationship with some heavy metals in oat grain are largely unexplored. In the present study, the Si levels of 22 oat genotypes in 4 different grain parts (the cortex, aleuronic layer, near aleuronic layer and center of caryopsis) were determined by environmental scanning electron microscopy combining with X-ray electron probe microanalysis, and its relevancy with the contents of other metals in the whole oat grain, including P, Mg, K, Ca, S, Cd, Al and Pb, were analysed. There was remarkable difference in Si levels among different portions of oat grain, with higher Si contents in the cortex and aleuronic layer, while less Si in the near aleuronic layer and center of caryopsis, which implied that Si predominantly deposited in the aleuronic layer for a whole oat caryopsis. Moreover, the considerable difference in Si level was also existed among the different oat genotypes, with a comparison of the same portion of different oat cultivars, suggesting that oat genotypes had a dominant effect on Si accumulation. Si content in aleuronic layer was closely related to that in near aleuronic layer and center of caryopsis. Furthermore, a significant non-linear correlation between the content of Si and that of P, Ca, Mg, S, Al, Pb in different parts of oat grains was observed, but no significant non-linear relationship existed between the content of Si and that of K、Cd in the center of caryopsis. The Si accumulation might facilitate the accumulation of P, Ca, Mg, S, Al and Pb.
Keywords:Si  oat grain  silicon  X-ray electron probe microanalysis  accumulation
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