Identification of RAPD markers for 11 Hessian fly resistance genes in wheat |
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Authors: | I Dweikat H Ohm F Patterson S Cambron |
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Institution: | (1) Agronomy Department, 1150 Lilly Hall, Purdue University, West Lafayette, IN 47907, USA, US;(2) Entomology Department and USDA-ARS, Purdue University, West Lafayette, IN 47907, USA, US |
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Abstract: | The pyramiding of genes that confer race- or biotype-specific resistance has become increasingly attractive as a breeding
strategy now that DNA-based marker-assisted selection is feasible. Our objective here was to identify DNA markers closely
linked to genes in wheat (Triticum aestivum L.) that condition resistance to Hessian fly Mayetiola destructor (Say)]. We used a set of near-isogenic wheat lines, each carrying a resistance gene at 1 of 11 loci (H3, H5, H6, H9, H10, H11, H12, H13, H14, H16 or H17) and developed by backcrossing to the Hessian fly-susceptible wheat cultivar ‘Newton’. Using genomic DNA of these 11 lines
and ‘Newton’, we have identified 18 randomly amplified polymorphic DNA (RAPD) markers linked to the 11 resistance genes. Seven
of these markers were identified by denaturing gradient gel electrophoresis and the others by agarose gel electrophoresis.
We confirmed linkage to the Hessian fly resistance loci by cosegregation analysis in F2 populations of 50–120 plants for each different gene. Several of the DNA markers were used to determine the presence/absence
of specific Hessian fly resistance genes in resistant wheat lines that have 1 or possibly multiple genes for resistance. The
use of RAPD markers presents a valuable strategy for selection of single and combined Hessian fly resistance genes in wheat
improvement.
Received: 20 March 1996 / Accepted: 6 September 1996 |
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Keywords: | Wheat RAPD Marker-assisted selection Hessian fly |
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