电子鼻技术在快速检测小麦矮腥黑穗病菌中的应用

由小麦矮腥黑穗病菌(TCK)引起的小麦矮腥黑穗病是我国重要的检疫性病害,为明确电子鼻技术在快速检测小麦矮腥黑穗病菌方面的可行性,利用电子鼻对含有TCK和小麦光腥黑穗病菌(TFL)不同冬孢子数(50g小麦种子中冬孢子数分别为0、100、101、102、103、104、105)的小麦进行了检测,采用主成分分析法(PCA)和线性判别法(LDA)进行数据分析。结果发现,这2种分析方法均可将不含TCK冬孢子的小麦和含TCK冬孢子的小麦区分开来,而且通过LDA分析,可将TCK冬孢子含量为100、101、102及103以上的处理区分开来。另外,通过PCA分析,可将TCK与TFL区分开来。此结果为电子鼻技术在快速检测小麦矮腥黑穗病菌中的应用奠定了基础。

Rapid detection of Tilletia controversa Kühn in wheat grain by electronic nose

Dwarf bunt of wheat, caused by Tilletia controversa Kühn （TCK）, is an important quarantine disease in China. To determine the feasibility of electronic nose in rapid detection of TCK, wheat grains containing different numbers of TCK or T.foetia （Wallr.） Liro （TFL） teliopores （0, 100, 101, 102, 103, 104, 105 teliopores in 50 g wheat grains, respectively） were testified by using electronic nose. Data were analyzed by principal component analysis （PCA） and linear discriminant analysis （LDA）. The results showed that wheat without TCK teliopores could be distinguished from those with TCK teliopores by using these 2 analysis methods. And it was also possible to distinguish 0, 100, 101, 102 and ≥103 TCK teliopores in 50 g wheat grains by using LDA. Moreover, TCK and TFL could be distinguished by using PCA. Therefore, this study laid a foundation for application of electronic nose in rapid detection of TCK in wheat grain.