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A study of the budding ofSaccharomyces uvarum Beijerinck with the scanning electron microscope
Authors:J. -M. Belin
Affiliation:(1) Laboratoire de Botanique Appliquée, I.B.A.N.A. Faculté des Sciences, 21-Dijon, France
Abstract:Vegetative cells ofSaccharomyces uvarum Beijerinck in the exponential growth phase were examined with the scanning electron microscope. The existence of two types of scars — birth scars and bud scars — was confirmed. Birth scars had larger diameters than bud scars; both remained visible on old cells. The distribution of the buds on the mother cell did not appear to be a random one: there seemed to be a more or less emphasized cell polarity. The author wishes to thank Mr. Bert for technical assistance in the use of the scanning electron microscope.
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