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女贞和珊瑚树叶片表面特征的AFM观察
引用本文:石辉,王会霞,李秧秧,刘肖.女贞和珊瑚树叶片表面特征的AFM观察[J].生态学报,2011,31(5):1471-1477.
作者姓名:石辉  王会霞  李秧秧  刘肖
作者单位:1. 西安建筑科技大学环境与市政工程学院,西安,710055
2. 西北农林科技大学水土保持研究所,杨凌,712100
3. 榆林市土壤肥料工作站,陕西榆林,719000
基金项目:国家自然科学基金项目(31070541);陕西省环境科学重点学科建设项目资助
摘    要:应用原子力显微镜观察了女贞(Ligustrum lucidum)、珊瑚树(Viburnum odoratissimum)幼叶和成熟叶的表面特征,并探讨了叶面微结构对滞尘能力的可能影响以及抵抗干旱、污染物等胁迫的能力。女贞幼叶和成熟叶正背面的粗糙度Ra分别为417.8、794.5,1069、957.4 nm;珊瑚树幼叶和成熟叶正背面的粗糙度Ra分别为471.3、469.6,291.1、865.9 nm。和幼叶相比,成熟叶表面的粗糙度发生变化,但2个物种的变化趋势不同,这种变化可能与气孔的发育以及外界环境条件对叶片表面形态结构、蜡质含量和成分的影响不同有关。叶片表面存在大量的沟状、孔状峰谷区域和直径约为10 μm的凹陷,有利于PM10的滞留。女贞和珊瑚树成熟叶气孔只分布在叶下表皮且下陷。这些特征均说明女贞和珊瑚树具有较强的滞尘能力和抵抗干旱、污染物胁迫的能力,作为绿篱植物对消减城市大气颗粒物污染和提高空气质量具有重要的意义。

关 键 词:原子力显微镜  叶表面微结构  粗糙度  滞尘
收稿时间:7/1/2010 12:00:00 AM
修稿时间:2011/1/18 0:00:00

Leaf surface microstructure of Ligustrum lucidum and Viburnum odoratissimum observed by Atomic force microscopy (AFM)
SHI Hui,WANG Huixi,LI Yangyang and LIU Xiao.Leaf surface microstructure of Ligustrum lucidum and Viburnum odoratissimum observed by Atomic force microscopy (AFM)[J].Acta Ecologica Sinica,2011,31(5):1471-1477.
Authors:SHI Hui  WANG Huixi  LI Yangyang and LIU Xiao
Institution:School of Environmental and Municipal Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, China;School of Environmental and Municipal Engineering, Xi'an University of Architecture and Technology, Xi'an 710055, China;Institute of Soil and Water Conservation, Northwest A&F University, Yangling 712100, China;Soil and Fertilizer Working Station of Yulin, Yulin 719000, China
Abstract:Leaf surfaces are multifunctional interfaces between plant and their environment which affect both ecological and biological processes.Leaf surface topography is an important characteristic that directly affects microhabitat and microclimate availability for dust deposition,water storage and microbial colonization.However,few studies have been conducted which measure accurately the three dimensional structure of the leaf surface or record precise changes of leaf surface microstructure over time.The Atomic F...
Keywords:atomic force microscopy (AFM)  leaf surface morphology  roughness  dust capturing
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