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Persistent luminescence of CaMgSi2O6:Eu2+,Dy3+ and CaMgSi2O6:Eu2+,Ce3+ phosphors prepared using the solid‐state reaction method
Authors:P Chandrakar  R N Baghel  D P Bisen  B P Chandra
Institution:School of Studies in Physics and Astrophysics, Pt. Ravishankar Shukla University Raipur, India
Abstract:CaMgSi2O6:Eu2+,Dy3+ and CaMgSi2O6:Eu2+,Ce3+ phosphors were synthesized using the solid‐state reaction method. X‐Ray diffraction (XRD) and photoluminescence (PL) analyses were used to characterize the phosphors. The XRD results revealed that the synthesized CaMgSi2O6:Eu2+,Dy3+ and CaMgSi2O6:Eu2+,Ce3+ phosphors were crystalline and are assigned to the monoclinic structure with a space group C2/c. The calculated crystal sizes of CaMgSi2O6:Eu2+,Dy3+ and CaMgSi2O6:Eu2+,Ce3+ phosphors with a main (221) diffraction peak were 44.87 and 53.51 nm, respectively. Energy‐dispersive X‐ray spectroscopy (EDX) confirmed the proper preparation of the sample. The PL emission spectra of CaMgSi2O6:Eu2+,Dy3+ and CaMgSi2O6:Eu2+,Ce3+ phosphors have a broad band peak at 444.5 and 466 nm, respectively, which is due to electronic transition from 4f65d1 to 4f7. The afterglow results indicate that the CaMgSi2O6:Eu2+,Dy3+ phosphor has better persistence luminescence than the CaMgSi2O6:Eu2+,Ce3+ phosphor. Copyright © 2015 John Wiley & Sons, Ltd.
Keywords:afterglow properties  CaMgSi2O6:Eu2+  Dy3+  CaMgSi2O6:Eu2+  Ce3+ phosphors  XRD  photoluminescence
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