首页 | 本学科首页   官方微博 | 高级检索  
   检索      


Reflection contrast microscopy of ultrathin sections in immunocytochemical localization studies: a versatile technique bridging electron microscopy with light microscopy
Authors:Frans A Prins  Ronnie van Diemen-Steenvoorde  Jan Bonnet  Ingrid Cornelese-ten Velde
Institution:(1) Department of Pathology, University of Leiden, P.O. Box 9603, NL-2300 RC Leiden, The Netherlands;(2) Department of Cytochemistry and Cytometry, Sylvius Laboratories, University of Leiden, Wassenaarseweg 72, NL-2333 AL Leiden, The Netherlands;(3) Department of Physiology, University of Amsterdam, A.M.C., Meibergdreef 15, NL-1105 AZ Amsterdam, The Netherlands
Abstract:Reflection contrast microscopy (RCM) of ultrathin sections was recently introduced as a sensitive technique for visualization with enhanced definition in immunogold histochemistry. Experience of using RCM as a major tool in immunocytochemical research in different fields is summarized, e.g. oncology, nephrology and embryology. The sensitive visualization of immunocytochemical labels, gold particles or peroxidase-diaminobenzidine deposits in or on ultrathin sections, by RCM instead of electron microscopy is demonstrated. RCM of ultrathin sections is an adequate light microscopical alternative for immunoelectron microscopy, since an overview of both label and tissue is obtained with a high image definition and high contrast of label. In the studies presented, RCM is shown to provide a better gradation in staining intensity and staining pattern than other light microscopical methods. Moreover, a precise localization of multiple labels is obtained with this method. Besides the applications shown, ultrathin section visualization by RCM is very useful for correlative light- and electron microscopical studies of fine structures. Commercially available fluorescence microscopes can be adapted for proper RCM functioning; an adaptation scheme and list of microscopes tested is provided.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号