The Interpretation of Low-Angle X-Ray Data from Planar and Concentric Multilayered Structures: The Use of One-Dimensional Electron Density Strip Models

The use of one-dimensional electron density strip models in interpreting low-angle X-ray data from planar and concentric multilayered structures is described. Diffraction formulas for an n-strip model are given. Fourier transforms, normalization constants, and Patterson functions are derived for certain strip models.