首页 | 本学科首页   官方微博 | 高级检索  
   检索      


Identification of molecular markers linked to the Yr15 stripe rust resistance gene of wheat originated in wild emmer wheat, Triticum dicoccoides
Authors:G L Sun  T Fahima  A B Korol  T Turpeinen  A Grama  Y I Ronin  E Nevo
Institution:(1) Institute of Evolution, University of Haifa, Mount Carmel, Haifa 31905, Israel, IL;(2) Agricultural Research Organization, The Volcani Center, P. O. Box 6, Bet Dagan 50250, Israel, IL
Abstract: The Yr15 gene of wheat confers resistance to the stripe rust pathogen Puccinia striiformis West., which is one of the most devastating diseases of wheat throughout the world. In the present study, molecular markers flanking the Yr15 gene of wheat have been identified using the near-isogenic-lines approach. RFLP screening of 76 probe-enzyme combinations revealed one polymorphic marker (Nor/TaqI) between the susceptible and the resistant lines. In addition, out of 340 RAPD primers tested, six produced polymorphic RAPD bands between the susceptible and the resistant lines. The genetic linkage of the polymorphic markers was tested on segregating F2 population (123 plants) derived from crosses between stripe rust-susceptible Triticum durum wheat, cv D447, and a BC3F9 resistant line carrying Yr15 in a D447 background. A 2.8-kb fragment produced by the Nor RFLP probe and a 1420-bp PCR product generated by the RAPD primer OPB13 showed linkage, in coupling, with the Yr15 gene. Employing the standard maximum-likelihood technique it was found that the order OPB13 1420 Yr15Nor1 on chromosome 1B appeared to be no less than 1000-times more probable than the closest alternative. The map distances between OPB13 1420 Yr15Nor1 are 27.1 cM and 11.0 cM for the first and second intervals, respectively. The application of marker-assisted selection for the breeding of new wheat cultivars with the stripe rust resistance gene is discussed. Received: 27 February 1997/Accepted: 7 March 1997
Keywords:  Gene mapping  RAPD  RFLP  Stripe rust  Triticum dicoccoides  Triticum durum
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号