Identification of RAPD markers linked to a black leaf spot resistance gene in Chinese elm |
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Authors: | H. Benet R. P. Guries S. Boury E. B. Smalley |
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Affiliation: | 1. Centre d'Etudes Océanographiques et de Biologie Marine, CNRS, UPR 4601, F-29680, Roscoff, France 2. Department of Forestry, University of Wisconsin-Madison, 1630 Linden Drive, 53706-1598, Madison, WI, USA 3. Groupement d'Intérêt Publique Prince de Bretagne Biotechnologie, Penn Ar Prat, F-29250, Saint Pol de Léon, France 4. Department of Plant Pathology, University of Wisconsin-Madison, 1630 Linden Drive, 53706-1598, Madison, WI, USA
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Abstract: | ![]() Black leaf spot (Stegophora ulmea) is a common foliage disease on Chinese (Ulmus parvifolia) and Siberian elms (U. pumila), two species which have been widely used as sources of Dutch-elm disease-resistance genes for interspecific elm hybrids. A dominant gene controlling resistance to black leaf spot was identified in a population derived from self-pollination of a single U. parvifolia tree. Using RAPD markers, in combination with bulked segregant analysis, we have identified three markers linked to this resistance gene. A survey of Chinese-elm hybrids revealed that the same gene is likely to confer a high level of resistance to black leaf spot in interspecific elm hybrids, although other genetic factors may also be involved in the determination of a disease phenotype. |
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