Diallel analysis of the latent period of stripe rust in wheat |
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Authors: | M. R. Ghannadha I. L. Gordon M. G. Cromey J. M. McEwan |
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Affiliation: | (1) Seed and Crop Group, Plant Science Department, Massey University, Palmerston North, New Zealand;(2) Crop & Food Research, Christchurch, New Zealand;(3) Crop & Food Research, Palmerston North, New Zealand |
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Abstract: | A half diallel was made amongst five wheat (Triticum aestivum L.) genotypes of which one was susceptible, while the others had adult-plant resistance, to stripe rust (Puccinia striiformis West.). The five parent and ten F1 progeny were grown in the glasshouse and were inoculated with three rust pathotypes at the seedling stage. The latent period was measured on the first leaf. Two procedures were used to analyze the half diallel. Both methods showed that the average effects of alleles were of much greater importance than was dominance in conditioning resistance in response to two of the pathotypes, while for the third pathotype dominance was important. Resistance was conditioned by partial dominance for two pathotypes whereas for the third it was determined by full dominance. Broad-sense heritabilities range from 60–73% and the number of genes involved was different (from 1 to 4), depending on the pathotype. |
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Keywords: | Wheat Puccinia striiformis Stripe (yellow) rust Diallel analysis Latent period |
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